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Automation.com Real-time Information for the Automation Professional Nov. 21, 2008

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Keithley Instruments, Inc. News & Product Announcements
Read about the latest news, products, mergers, and acquisitions in the automation, process control, and instrumentation industries for Keithley Instruments, Inc.

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		Keithley holds Nano Days virtual conference April 24-26 During this virtual conference on The Future of Nanotechnology, leading researchers from academia and business leaders from industry will present Six live audio/visual seminars. Two seminars will be held each day of the three-day conference. Each seminar is approximately 45 minutes long and includes interactive question and answer during each seminar. No charge to attend.

		Keithley Instruments adds three distributors in Mexico - 11/06/08 Distributors include SCM, Signal Test and Final Test.

		Keithley enhances SignalMeister Communications Toolkit software - 11/04/08 SignalMeister software now has RF signal analysis and RF signal generation.

		Keithley introduces Model 2308 battery/charger simulator - 09/23/08 Model 2308 is suited for design and test of low-power, battery-operated devices.

		Keithley creates WiMAX tutorial poster - 08/13/08 Poster illustrates the key measurement tools and software analysis techniques required for measuring complex WiMAX signals.

		Keithley releases guide to wireless and RF Testing - 07/24/08 Free CD contains RF testing resources, including application notes, articles, white papers, and product demonstrations.

		Keithley adds plug-in cards to 3700 Multimeter Line - 07/15/08 Cards include Model 3724 Dual 1X30 Solid State FET Relay Multiplexer Card and the Model 3750 Multifunction I/O Card.

		Keithley announces WiMAX test tools - 06/17/08 WiMAX test systems provide frequency coverage from 400MHz to 4GHz and to 6GHz if WLAN measurements are needed.

		Keithley And Azimuth Systems to create wireless testing solutions - 06/16/08 Keithley and Azimuth Systems will deliver RF test solutions for next-generation LTE and WiMAX testing.

		Keithley offers free Precision Sourcing and Measurement Guide CD - 05/13/08 CD contains sourcing and measurement resources, including application notes, articles, white papers, and product demonstrations.

		Keithley releases Semiconductor Device Test Applications CD - 05/08/08 CD includes a large variety of semiconductor test application information such as applications notes, white papers, presentations and an Applications Guide.

		Keithley publishes switching test handbook - 05/05/08 Handbook covers fundamentals of the switching function in test and measurement applications, providing useful, tutorial information on how to optimize switching test systems.

		Keithley publishes 2008 Test and Measurement Product Guide - 01/30/08 Product guide covers measurement products, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware.

		Keithley joins WiMAX Forum - 12/13/07 The WiMAX Forum is an industry-led, non-profit organization responsible for promoting and certifying interoperable WiMAX products, such as laptops and other mobile devices over much longer distances than Wi-Fi.

		Keithley's German service center accredited to ISO 17025 - 10/01/07 The American Association for Laboratory Accreditation (A2LA) has accredited Keithley's German service center to ISO/IEC 17025:2005.

		Keithley supports nanotechnology research at UCLA - 09/20/07 Keithley announced a partnership agreement with The California NanoSystems Institute at UCLA.

		Keithley announces Series 3700 System Switch/Multimeter - 09/13/07 The Series 3700 offers scalable, high-performance switching and multi-channel measurements that are optimized for automated testing of electronic products and components.

		Keithley adds low-current capability to SourceMeter - 09/13/07 Models 2635 and 2636 provide DC and pulse testing from femtoamps and microvolts up to 200V/1.5A for semiconductor analysis and testing.

		Keithley offers SignalMeister waveform software - 08/21/07 SignalMeister software creates arbitrary waveform (ARB) files that can be downloaded to Keithley's Model 2910 RF Vector Signal Generator.

		Keithley partners with CEA LETI to pursue nanotechnology - 07/18/07 The two will research methods for characterizing advanced semiconductor materials and devices.

		Keithley qualifies FormFactor to make probe cards - 07/18/07 FormFactor will manufacture high performance parametric test probe cards for Keithley’s semiconductor parametric testers.

		Keithley goes to Linux on S600 Series test system - 07/17/07 Other enhancements include firmware upgrades and a hardware key for each tester in the form of a USB Stick.

		Keithley introduces Model 2100 6½-digit USB DMM - 06/26/07 Model 2100 is suitable for production test, burn-in, and manual and R&D applications in bench or portable configurations. Price: $795.

		Keithley enhances 2910 RF Vector Signal Generator - 06/06/07 Enhancements include additional wireless signal generation waveforms, power calibration, and increased ARB memory.

		Keithley launches ACS test system for semiconductors - 04/12/07 ACS (Automated Characterization Suite) integrated test systems perform semiconductor characterization at the device, wafer, and cassette level.

		Keithley publishes handbook on nanotechnology - 04/05/07 The free handbook offers practical assistance in making precision low level DC and pulse measurements on nanomaterials and devices and provides an overview of the theoretical and practical considerations involved in measuring low currents, high resistances, low voltages, and low resistances.

		Keithley publishes data acquisition, measurement and control handbook The free 220+-page "Understanding New Developments in Data Acquisition, Measurement, and Control" handbook is a practical guide to high performance test and measurement. The handbook is divided into nine sections that discuss issues influencing the selection of data acquisition and control equipment.

		Keithley Instruments announces Winners of Nanotech measurement contest - 02/14/07 The contest objective was to foster development and propagation of improved test techniques to advance nanotech measurement art. Researchers who submitted entries are making complex and advanced measurements for applications as diverse as characterization of carbon nanotubes, electrical contact resistance, electrode spacing via atomic layer deposition, characterization of semiconductor junctions, and studies of nanoscale electrochemical modification in electronic devices.

		Keithley introduces handbook for parametric parallel test - 02/01/07 The 60-page handbook offers an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple tests on multiple scribe line test structures and helps semiconductor fabs maximize their test throughput and reduce their cost of test.

		Keithley wins semiconductor industry award - 01/31/07 Keithley was recognized for outstanding customer satisfaction by VLSI Research Inc, who provides independent customer evaluations of semiconductor equipment suppliers.

		Keithley upgrades circuit board test develpment software - 12/07/06 Enhancements to KTE V5.2 Interactive Test Environment software for the Series S600 Parametric Test System increase throughput for circuit materials testing, such as those requiring RF level frequencies, and improve parallel test routines used for lab and production applications.

		Keithley introduces GPIB interface board - 11/28/06 Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board provides complete software support for Windows XP and 2000. It supports industry-standard VISA (Virtual Instrument Software Architecture) libraries, and its driver library is fully compatible with Keithley, Capital Equipment Corporation (CEC), and National Instruments (NI) command sets. Price: $399.

		Keithley publishes 2007 test and measurement product catalog - 11/28/06 This desktop reference guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications.

		Keithley introduces new version of test software for improved pulse measurements - 11/21/06 Pulse testing is becoming an increasingly important new characterization technique. The high-speed pulses eliminate potential damage from self-heating effects and are used to characterize new semiconductor materials and devices in applications such as charge trapping for high-k gate stack characterization. Keithley’s Model 4200-PIV package extends the capabilities of the Model 4200-SCS to include pulse generation and analysis for material and device characterization.

		Keithley introduces PXI products for hybrid test systems - 11/14/06 KPXI products are for high speed automated production testing as part of a hybrid test system using precision instruments. Test engineers and designers can combine high-speed data acquisition and tight trigger synchronization of the KPXI products with the precision measurement capabilities in Keithley instruments for a hybrid test system architecture.

		Keithley and Mesatronic advance parametric wafer probe technology - 11/08/06 Keithley and Mesatronic developed advanced probe cards for semiconductor parametric testers used in RF and low current DC applications. When the new probe cards are available later this year, they can be used with Keithley parametric testers for simultaneous extraction of RF and very low level DC current parameters on any combination of probe pins that contact a semiconductor wafer.

		Keithley introduces flexible vector Signal Analyzer - 10/31/06 Model 2810 RF Vector Signal Analyzer is optimized for automated testing of wireless devices and transmitter circuits in production test environments, as well as in new product and device research and development. Keithley claims it has measurement speeds up to three times faster than competitive instruments in production test, takes up half the space, and costs half as much as competitive products.

		Keithley introduces lab quality, handheld RF Power Meter - 10/17/06 Designed to make RF power measurements in both field and R&D lab environments, the compact Model 3500 provides the accuracy of a benchtop RF power meter with the convenience of a portable instrument at half the cost of competing products. With a wide frequency range of 10MHz to 6GHz, the Model 3500 is useful in a variety of applications, including test of mobile phone and cellular infrastructures, WLAN devices, RFID readers, WiMax devices, and wireless sensors.

		Keithley’s Metrology Services earns ISO 17025 accreditation - 09/07/06 Keithley's Metrology Services Group is now accredited to ISO/IEC 17025:2005, the single most important metrology standard for test and measurement, by the A2LA (American Association for Laboratory Accreditation).

		Keithley offers training course on remote control of instruments in a LabVIEW® environment - 08/22/06 During this two-day, hands-on course, attendees will learn how to assemble and configure instruments from a variety of vendors into an efficient test setup, and control all of them from a single software interface. Attendees will be able to avoid costly delays by learning how to recognize common test system data communication issues and to steer clear of measurement errors by learning how to coordinate the operation of multiple instruments.

		Keithley sponsors Weblog for Semiconductor testing - 08/10/06 Keithley Instruments, Inc. announces the first Weblog, or Blog, designed exclusively for engineers confronting testing issues in the semiconductor industry. The Semiconductor Test Blog informs visitors of the latest technical and business developments in the semiconductor industry and their impact on testing.

		Keithley wins R&D 100 Award - 08/01/06 Keithley Instruments, Inc. ( NYSE:KEI), announces that Research & Development Magazine has named Keithley Instruments, Inc., Cleveland, Ohio, as one of the recipients of the 2006 R&D 100 Award for the Series 2600 System SourceMeter Instruments. Winners of this prestigious award are chosen each year by a panel of industry experts who review hundreds of entries from universities, private corporations, and labs around the world to select the 100 most technologically significant products and processes introduced during the previous year.

		Keithley receives award for semiconductor manufacturing solutions - 07/06/06 Keithley Instruments, Inc. (NYSE:KEI), announces it has received the prestigious Editors’ Choice Best Product Award, presented annually by Semiconductor International magazine, for its Model 4200-SCS Semiconductor Characterization System with Pulse I-V (PIV) Package.

		Keithley to present test Industry Expert Seminar series at SEMICON West on July 12 - 06/27/06 Keithley test industry experts will be presenting the seminars on Wednesday, July 12, in Room 3010 in the West Hall Level 3 of the Moscone Center. Doors open at 11 AM with refreshments served and a cocktail reception following the presentations beginning at 5 PM.

		Keithley Sponsors First Weblog For Nanotechnology Electrical Testing - 05/25/06 The Nanotest Weblog keeps visitors abreast of the latest news in the nanotechnology and MEMS industry through frequent posts of technical and business developments. Linda Bell, Publisher of Nanotech Briefs, said she expects the new blog to be an important contribution to the emerging field of nanotechnology.

		Keithley Instruments wins Electronics Magazine Asia's Innovation Award - 05/22/06 The Innovation Award, created to recognize excellence in the Asian electronics industry, was presented at the magazine's awards ceremony on April 5, 2006. The Model 2910 features an unrivaled combination of high-performance, speed, flexibility, ease of use, and compact size. Its design includes a patent-pending synthesizer, Software-Defined Radio (SDR) architecture, unique power leveling techniques, and a touch-screen user interface.

		Nanotech Measurement Contest Offers $5000 in Cash Prizes for Innovative Test Applications - 05/11/06 The aim of the contest is to encourage researchers and development engineers to share nanotech electrical measurement techniques that will help the industry at large. The editors of R&D Magazine will judge the contest entries. Three prizes will be awarded: 1st Place - $2,500; 2nd Place - $1,500; and 3rd Place - $1,000.

		Keithley Introduces New Line of Pulse and Pattern Generators - 04/25/06 Series 3400 Pulse/Pattern Generators provide signal quality and precise control for pulse widths from three nanoseconds to 1000 seconds, as well as a simple, intuitive user interface. Series 3400 pulse and pattern generators are ideal for semiconductor device and material research and characterization, as well as in process integration and advanced materials research applied to such projects as nanotechnology in R&D labs and technology development labs.

		Keithley Extends Source-Measurment Unit Line - 03/08/06 Models 2611 and 2612 add higher voltage and higher current capabilities to Keithley's source-measure unit (SMU) platform, significantly lowering the cost of test for a wide range of electronic components. The 200V and 10A capabilities of the two new models make them ideal for functional test and I-V characterization of silicon and compound semiconductor devices like FETs, diodes, voltage regulators, and optoelectronic components.

		Keithley Plays Key Role in New IEEE Test Standards for Carbon Nanotubes - 03/07/06 The recently approved IEEE 1650TM-2005 standard, known as “Standard Methods for Measurement of Electrical Properties of Carbon Nanotubes,” gives the burgeoning nanotechnology industry one uniform and common set of recommended testing and data reporting procedures for evaluating the electrical properties of carbon nanotubes. The Model 4200 is a core measurement platform for engineers involved in nanotech materials research.

		Keithley Publishes New Edition of Switching Handbook - 03/06/06 The 190-page handbook covers the fundamentals of the switching function in test and measurement applications and is available for no charge on the Keithley website. The handbook is divided into seven sections and discusses topics such as: Switching components; Issues in switch system design; Hardware implementation; Applications

		Keithley Receives Test of Time Award From Test & Measurement World Magazine - 02/21/06 Series 2400 SourceMeter® Instruments have received the Test of Time Award from Test & Measurement World Magazine. The Test of Time Award, which was created to recognize product lines that provide state-of-the-art performance for at least five years after their introduction, was announced at the magazine’s awards ceremony on February 9, 2006, during the APEX Show in Anaheim, California.

		Keithley Recognizes 60 Year Milestone of Innovation - 01/17/06 Founded in 1946, Keithley today has expanded its measurement portfolio far beyond its patented sensitive DC measurement capabilities to now include additions to its product line with RF (radio frequency) and pulse measurement technologies.

		Keithley Introduces New Line of RF Test Instruments - 01/17/06 These instruments employ new approaches to test and measurement that enable users to save time, effort, and money. The first product available in this line is the Model 2910 RF Vector Signal Generator.

		Keithley Publishes 2006 Test and Measurement Product Catalog - 01/05/06 This desktop reference guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications.

		Keithley Opens New Offices in Asia to Optimize Local Applications and Customer Support - 10/17/05

		Hamilton Receives 2005 IEEE Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement - 09/01/05

		Keithley Wins 19th Prestigious R&D 100 Award - 08/30/05

		Keithley Introduces Interactive Test & Measurement Troubleshooting Guide on CD - 08/22/05

		Keithley Introduces New Pulse Measurement Solution for Semiconductor Device Characterization - 07/12/05

		Keithley Publishes New Semiconductor Test Tutorial Handbook - 07/12/05

		Keithley, Silver Sponsor of Nanotech 2005, Presents Three Technology Seminars During Conference - 05/06/05

		Keithley Introduces the S510 Semiconductor Reliability Test System - 04/11/05

		Keithley Introduces the Series KUSB-3100 USB-based Data Acquisition Solutions - 03/17/05

		Keithley Receives a Repeat Multiple-system Order for Its S680 DC/RF Parametric Test Systems - 03/14/05

		Keithley Introduces Industry's Fastest, Smallest, and Most Cost-effective Source-Measure Units for Multi-channel Applications - 03/01/05

		Keithley Introduces 3rd Generation of On-wafer RF Measurement Capability - 03/01/05

		Keithley's Model S680 Semiconductor Test Sustem Selected by AMD FAB 36 in Germany - 02/02/05

		Keithley Expands Switching Product Line, Offering Industry’s Highest Density Half-Rack Switching System - 01/19/05

		Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices - 01/12/05

		Keithley Publishes 2005 Test and Measurement Catalog - 11/24/04

		Keithley Announces that Linda Rae Will Give Keynote at EOEM Design Online Expo - 10/12/04

		Keithley Releases USB-to-GPIB Interface Adapter - 10/12/04

		Keithley Publishes Updated Low Level Measurements Handbook - 10/07/04

		Keithley Introduces Ready-To-Run 200mm Wafer Test System For 130NM Node And Beyond - 07/14/04

		Keithley Launches Model 2182A Nanovoltmeter For Eliminating Noise In Low Voltage Measurements - 07/14/04

		Keithley Releases Precision DC And AC/DC Current Sources - 07/14/04

		Keithley Expands RF Measurement Capability To GSM Transmitter Modulation Quality Measurements - 07/08/04

		Keithley Creates How-To Temperature Measurements CD - 06/08/04

		IEEE Presents Henry P. Hall with the 2004 Joseph F. Keithley Award for Outstanding Contributions in the Field of Electrical Measurement - 06/08/04

		Joseph F. Keithley Award Presented by American Physical Society for Advances in Measurement Science - 06/08/04

		Keithley Publishes Four Step Error Checker Poster for Low-level Measurement - 05/18/04

		Keithley Enters Agreement To Distribute Elgar Power Supplies In Asia - 04/02/04

		Keithley Creates Measurement How-To Library On CD - 03/25/04

		Keithley Releases Free Measurement Software Toolkit For Nanotech Researchers - 03/03/04

		Keithley Instruments, Inc. Partners with Albany NanoTech Center Further the Understanding of Nanotechnology and Optoelectronics Technologies - 02/02/04

		Keithley Instruments, Inc. Announces Two New Multi-Channel Source-Measure Test Cards - 12/18/03

		Keithley Instruments, Inc. Announces Availability of its Model 4200-SCS Semiconductor Characterization System - 12/15/03

		Keithleys New System Tests 300MM Wafers In 200MM Test Times - 12/04/03

		Keithley Announces its Model 2790-A SourceMeter® Airbag Inflator DC Electrical Test System - 11/25/03

		Keithley Publishes 2004 Test And Measurement Catalog -

		Keithley And Zyvex Sign Marketing Cooperation Agreement -

		Keithley Announces 40ghz Parametric Tester for Characterizing Thin Gate Dielectrics -