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| Aspectrics launches MultiComponent 2750 EP-NIR analyzer | ||
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CHICAGO, IL (February 26, 2007) - Aspectrics announces the launch of its Encoded Photometric Near Infrared (EP-NIR) process analyzer which will be displayed on the Aspectrics booth #4417 at PITTCON 2007, McCormick Place, Chicago, Illinois, February 26- March 1, 2007. Whereas traditional NIR systems typically stop at 2100nm, the novel MultiComponent 2750 analyzer covers an unprecedented spectral range of 1375-2750nm, allowing users access to information rich combination bands between 1950nm and 2750nm. This unique capability makes the new analyzer perfectly suitable for a wide range of applications including: Aspectrics’ innovative new EP-NIR analyzer offers a breakthrough in NIR analysis, facilitating ultra-fast scanning operation capable of acquiring an impressive 100 scans/second, resulting in high sample throughput, real-time quality control monitoring and extreme sensitivity through spectral averaging. Combining ultra-fast operation with rugged design, the analyzer incorporates a pre-aligned and pre-indexed process optical design ideally suited to meet the requirements of the demanding process environment. The proprietary EP-NIR technology has also recently achieved Military 202G Method 204D certification for successfully passing the High Frequency Vibration Resistance Test. Jim Yano, VP of Marketing comments, “Featuring software options from Aspectrics, the novel EP-NIR will result in a complete real-time process analyzer solution that will enable our customers to achieve faster and more reliable analyses.” About Aspectrics Founded in 2000 and based in Pleasanton, California, Aspectrics Inc. provides innovative Encoded Photometric Infrared Spectroscopy (EP-IR) analyzers to OEMs supplying detector instrumentation to chemical, pharmaceutical, biomedical, and automotive markets. Aspectrics holds seven U.S. patents and one European patent for its encoding disc technology and associated optics. Aspectrics’ EP-IR technology was pioneered by founder, Thomas W. Hagler, Ph.D. |
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