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Keithley Instruments, Inc. News
| Keithley Introduces Tutorial CD for Reliability Testing of Semiconductor Devices |
.jpg) Cleveland, OH – January 12, 2004 – Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has released an interactive, tutorial CD on reliability testing for semiconductor test engineers. “Understanding Measurements: Essential Reliability Testing Techniques” provides information related to stress measure testing of semiconductor devices, new measurement techniques, and how to improve test throughput and maintain data integrity. The CD, which is the second in Keithley’s series of Test and Measurement Knowledge CDs, is available free of charge at www.keithley.com/pr/005.html The CD contains three web seminars that discuss a variety of testing issues in detail, including: Other material on the CD includes: For more information on Keithley's “Understanding Measurements: Essential Reliability Testing Techniques” CD, or any of its literature or products, contact the company at: Telephone: 800-688-9951, 440-248-0400 FAX: 440-248-6168 E-mail: product_info@keithley.com Internet: www.keithley.com Keithley Instruments, Inc. 28775 Aurora Road Cleveland, OH 44139-1891 About Keithley With more than 50 years of measurement expertise, Keithley Instruments (www.keithley.com) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products. |