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Keithley Instruments, Inc. News
| Keithley publishes 2007 test and measurement product catalog | ||
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Keithley publishes new 2007 test and measurement product catalog Cleveland, Ohio November 28, 2006 - Keithley Instruments announces the availability of its 2007 Test and Measurement Product Catalog. This desktop reference guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications. To request a free copy of Keithley's 2007 catalog, visit www.keithley.com/pr/065 Arranged by major product type and application area, each section of the catalog contains a tutorial on test-system design and use with practical tips to help users avoid common measurement errors, increase productivity, and lower their cost of test. The major catalog sections include: 1. Digital Multimeters and Systems 2. Switching and Control 3. RF/Microwave Switching and Instruments 4. Specialized Power Supplies 5. Source and Measure Products 6. Low Level Measurements and Sourcing 7. Pulse/Pattern Generators 8. PXI Hybrid System Products 9. Optoelectronic Test 10. Semiconductor Test 11. Data Acquisition Products About Keithley With 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Its products solve emerging measurement needs in production testing, process monitoring, product development, and research. The companys customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device and wafer characterization, and the production of end products such as electronic assemblies or portable wireless devices. The value Keithley provides its customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products. |
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