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Are you using or have you considered using wireless transmission for process control signals? |
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| Keithley releases Semiconductor Device Test Applications CD |
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Cleveland, Ohio - May 8, 2008 - Keithley Instruments announces the availability of the Semiconductor Device Test Applications Guide. In addition to the Applications Guide, this CD also includes a large variety of semiconductor test application information such as applications notes, white papers, and presentations that enables users to reduce their cost of test while simplifying the most challenging applications. The Semiconductor Device Test Applications Guide is available free of charge at www.ggcomm.com/Keithley/May08PR_SemiAppsGuide.html.
The Semiconductor Device Test Applications Guide is divided into six main sections with topics including:
Two-terminal device tests
Bipolar transistor tests
FET tests
Substrate bias
High power tests
The Semiconductor Device Test Applications Guide features more than a dozen application notes on topics such as on-the-fly Vth measurements for bias temperature instability characterization, increasing production throughput of multi-pin devices, optimizing switched measurements, white papers on test sequencing instruments and the fundamentals of the LXI communication protocol, six presentations, and an appendix of test scripts.
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
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