Test, Measurement & LIMS Portal 

FEATURED PRODUCTS

view all

RESOURCES

in Test, Measurement & LIMS Portal
  • Physik Instrumente publishes Beamline brochure 
    Physik Instrumente publishes Beamline brochure

    Beamline is used in laboratory and industrial experiments, including nanotomography, laminography, and systems with nanoscopic spatial resolution.

  • Keithley offers free App for Source Measure Unit (SMU) Instruments 
    Keithley offers free App for Source Measure Unit (SMU) Instruments

    Free app for Android-based smartphones and tablets interacts with a Keithley Series 2600B SourceMeter SMU instrument via its front panel USB interface

  • ABB lab in Germany accredited for calibration of gas analyzers 
    ABB lab in Germany accredited for calibration of gas analyzers

    Accreditation was awarded by the German Accreditation Service (DAkkS) in Berlin/Braunschweig.

  • view all

    WHITE PAPERS

    in Test, Measurement & LIMS Portal
  • Artifact Calibration and Its Use in Calibrating 8.5-Digit DMMs 
    Artifact Calibration and Its Use in Calibrating 8.5-Digit DMMs

    By Jack Somppi, Fluke Calibration
    This paper examines how the Artifact Calibration capabilities of the Fluke Calibration 5700 Series of
    ...

  • Flue gas monitoring sensors 
    Flue gas monitoring sensors

    By Tom Gurd, City Technology
    There is a lot of focus on flue gas analyzers, but it’s also important to remember that an analyzer is only as...

  • How to Measure Current and Make Power Measurements 
    How to Measure Current and Make Power Measurements

    By National Instruments
    Safely measuring large currents in a laboratory or production setting presents many challenges not associated with typical...

  • view all

    CASE STUDIES

    in Test, Measurement & LIMS Portal
  • A.G.T. measures metal thickness with lasers instead of radiation 
    A.G.T. measures metal thickness with lasers instead of radiation

    AGT uses Keyence LK-G Series laser sensors to provide continuous, high speed, accurate and reliable thickness measurements.

  • CAS data acquisition system cleans up detergent  tests 
    CAS data acquisition system cleans up detergent tests

    German detergent manufacturer Henkel replaced its old data recorders with 10 Delphin measurement data acquisition systems.

  • OpTek Systems uses confocal sensors on highly reflective and diffuse surfaces 
    OpTek Systems uses confocal sensors on highly reflective and diffuse surfaces

    OpTek Systems has installed non-contact confocal chromatic sensors from Micro-Epsilon on a number of its laser processing machines to measure the...

  • view all

    EVENTS

    in Test, Measurement & LIMS Portal
    August 3, 2015 - August 6, 2015
    Austin , TX, USA


    NIWeek delivers technical networking and instruction with interactive sessions by NI R&D engineers and guest lecturers; targeted industry summits; hands-on workshops; exhibitions on the latest advancements in design, research, and test; and keynote presentations from leading technology thought leaders.

    view all

    TRAINING

    in Test, Measurement & LIMS Portal
    July 2, 2015 - July 3, 2015
    San Francisco , CA, United States


    The goal is to develop and implement risk balance throughout the design, manufacturing, installation and device use process. It includes FDA guidance on Incorporating human factors into risk and FDA guidance on premarketing risk assessment.

    July 9, 2015 - July 10, 2015
    Singapore , CA, Singapore


    This course will begin by presenting a primer on statistical analysis, focusing on the methods required for analysis of designed experiments. It will then present the steps to DOE, while demonstrating valuable risk management tools (Ishikawa and FMEA) which can be use pre and post DOE studies.

    July 9, 2015 - July 10, 2015
    San Francisco , CA, United States


    The 2-day seminar begins with an examination of ISO and FDA regulations and guidelines regarding the use of statistics. Basic vocabulary and concepts are then reviewed and discussed.