Sierra introduces Smart-Trak 2 flow meters and controllers
Expanded Functionality of Smart-Trak 2 Includes:
Ideal for OEM, industry, or research applications, it builds upon the performance and user-friendliness end-users came to expect with the original Smart-Trak. Smart Trak 2 provides the most advanced linear sensor available, smoother valve performance, more robust electronics and more control over a wide range of functions.
With its advanced capabilities, the Compod, coupled with Sierras Smart-Trak Model100 mass flow meters or controllers, greatly simplifies basic flow control installations and permits networking of multiple instruments using open-source MODBUS RTU protocol.
By adding the Compod module to a new or existing Smart-Trak, end users can take complete control of gas mixing and blending, batch control, leak testing and process monitoring.
Yaskawa announces MH24 Robot
MH24 six-axis robot is suitable for assembly, dispensing, material handling, machine tending and packaging applications.
Turck releases TBEN-S Multiprotocol I/O Modules
The 32 mm TBEN-S modules can be operated automatically in PROFINET, Modbus TCP or EtherNet/IP.
Endress+Hauser Introduces Turbimax CUS52D Turbidity Sensor
Turbidity sensor provides fast, laboratory-quality measurements in real-time for the entire water purification process and many other process...
Yaskawa Introduces three motion control products
Yaskawa releases MP3300iec controller, VIPA SLIO I/O and MotionWorks IEC v3 software, which work together.
eRPortal updates Asset Management Software
Enhancements include advanced safety process management, sophisticated multi-level workflow, and serialized tool and component tracking.
Hexagon acquires Q-DAS software
Q-DAS software company specializes in Statistical Process Control (SPC) solutions for industrial manufacturing.
A.G.T. measures metal thickness with lasers instead of radiation
AGT uses Keyence LK-G Series laser sensors to provide continuous, high speed, accurate and reliable thickness measurements.
Physik Instrumente publishes Beamline brochure
Beamline is used in laboratory and industrial experiments, including nanotomography, laminography, and systems with nanoscopic spatial resolution.
Excitation current mismatch effects in three-wire RTD measurement systems, Part 1
Embedded Computing Design
By Collin Wells and Ryan Andrews, Texas Instruments
Part 1 of this three-part article discusses the principles and...
Smart Instruments Provide Condition-Based Maintenance
Mitsubishi’s chemical plant in Kashima, Japan, leverages real-time data via Field Device Tool (FDT) technology to transition...