What: This three-part series will explore a comparison of LXI and PXI measurement platforms, journey into maximizing the usefulness of each platform and then look at optimizing system performance using smart instruments in LXI.
Who: Design validation engineers and managers in the automotive, medical, industrial, communication and aerospace & defense industries. You may have product test responsibility and are evaluating future test needs or want to learn about new test technologies and trade-offs between test architectures
When: The first one-hour session will be held on July 24, 2007 and the series will finish on September 26, 2007. Content will also be available for on-demand viewing for those who cannot attend the live event.
*Comparing LXI and PXI as measurement platforms
July 24, 2007, 10AM-11AM PDT
*Getting the most out of LXI and PXI.
August 15, 2007, 10AM-11AM PDT
*Optimizing system performance, Using the capabilities of new, smart instruments
September 26, 2007, 10AM-11AM PDT
