Keithley Receives a Repeat Multiple-system Order for Its S680 DC/RF Parametric Test Systems |

Keithley Receives a Repeat Multiple-system Order for Its S680 DC/RF Parametric Test Systems

March 142005
Cleveland, OH – March 14, 2005 - Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, today announced it has received a repeat multiple-system order for its S680 DC/RF Parametric Test Systems from Hynix Semiconductor, Inc. Hynix is a leading Korean semiconductor manufacturer and one of the world's largest DRAM (Dynamic Random Access Memory) producers. The order includes testers for production process control of 300mm wafers being produced in Hynix's M3A fabrication facility, located in Icheon, Korea. It also includes testers for production process control of 200mm wafers being produced in Hynix’s M8/9 facility. The systems will monitor the production of Hynix's flash memory, DRAM, SRAM (Synchronous Random Access Memory), and system IC devices.

"Hynix continues to order our S680DC/RF testers because its earlier experience convinced its engineers that our systems offer both superior technical performance and a lower cost of ownership," stated William Yang, Keithley’s country manager for its Korean operations. "Our ability to combine fast test throughput, superior measurement integrity, and high cost-effectiveness is one of the major reasons the S680DC/RF is so widely accepted around the world."

"The repeat orders from semiconductor fabs for S680DC/RF systems validate the investment we’ve made to create a unique product that delivers leading-edge measurement capability without sacrificing ease-of-use," said Mark Hoersten, Keithley's vice president for business development. "Its unique architecture ensures superior measurement results at the probe tip for better process control of flash memory devices, and provides upgrade flexibility as new processes and devices are developed."

Keithley's Model S680 DC/RF Parametric Test System, introduced in 2003, is designed for wafer-level parametric testing of advanced logic, memory, and analog ICs. In a single test system, it combines parallel testing capability, high DC sensitivity, femtoamp-level resolution, and RF s-parameter measurements up to 40GHz. This provides the industry's highest throughput and a lower cost of ownership for measurements at the 65nm node and beyond.

For More Information. For more information on the Model S680 DC/RF Parametric Test System or any of Keithley’s semiconductor test solutions, visit

About Keithley Instruments, Inc.
With more than 50 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research. By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry. The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.

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