Keithley Announces that Linda Rae Will Give Keynote at EOEM Design Online Expo

  • October 12, 2004
  • Keithley Instruments
  • News
Cleveland, Ohio – October 12, 2004 – Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announces that Senior Vice President and General Manager Linda Rae will give the keynote address titled “Best in Test: How World Class Organizations Rely on Testing To Make Better Products” at the 2nd annual EOEM Design Online Expo. The live session takes place Wednesday, October 13, 2004, from 2:30 PM to 3:00 PM in the Test & Measurement Technology Pavilion. Rae’s presentation discusses the test philosophies at some of the world’s most successful electronics manufacturers, and the methods in which they use test strategies to improve their manufacturing processes and overall product quality.The EOEM Design Online Expo is an online conference and exhibition addressing critical technology areas impacting electronic design engineering. It runs from October 13th through the 14th and covers technology areas including embedded technology, integrated circuits, packaging & interconnects, passive components, power, and test & measurement. For more information on the Expo and to register online, visit

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