- November 08, 2006
- Keithley Instruments
Keithley and Mesatronic developed advanced probe cards for semiconductor parametric testers used in RF and low current DC applications. When the new probe cards are available later this year, they can be used with Keithley parametric testers for simultaneous extraction of RF and very low level DC current parameters on any combination of probe pins that contact a semiconductor wafer.
Did you enjoy this great article?
Check out our free e-newsletters to read more great articles..Subscribe