Keithley Publishes E-Handbook on Precision Measurements

  • April 27, 2011
  • Keithley Instruments
  • News

April 27, 2011 - Keithley Instruments published an informative e handbook titled "Making Precision Low Current and High Resistance Measurements." A free copy can be downloaded from Keithley's website. The e-handbook covers several topics crucial to ensuring low current measurement accuracy:

  • Measurement circuit
  •  Leakage currents and guarding
  • Noise and source resistance
  • Zero drift
  • Generated currents
  • Overload protection
  • AC interference and damping
  • Using a coulombmeter to measure low current

Topics addressed in the e-handbook related to high resistance measurements include:

  • Constant-voltage method
  • Constant-current method
  • Guarding
  • Settling time

In addition to these topics, the e-handbook provides two measurement applications examples: avalanche photodiode reverse bias current measurements and voltage coefficient testing of high ohmic value resistors. A useful glossary of low-level measurement terminology and a guide to selecting instruments suitable for low current and high resistance measurements, such as ammeters, electrometers, and ohmmeters, are included. In addition, links are provided to a variety of webinars, white papers, and application notes relevant to each topic area.

About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio.

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