PI releases Nanopositioning for Microscopy catalog

Summary

January 14, 2019, – With today’s technology, positioning of optics or samples with resolution in the sub-nanometer range is feasible and critical for improving the quality of images taken with a variety of techniques including fluorescent, widefield or laser scanning microscopy, SEM, FIB-SEM, TEM, AFM, and correlative microscopy. 

Selecting the best drive technology for each application can become a tedious job for the microscope designer as well as the researcher. PI’s “Nanopositioning for Microscopy” brochure is designed to simplify this selection process with flow charts and application tables.

Available in print and as interactive PDF with direct links to additional information on the PI website, this comprehensive overview of nanopositioning sample stages, non-magnetic linear motor stages, piezo nanofocus drives, objective & lens scanners, and multi-axis motion systems with up to 6 degrees of freedom is intended to address the needs of both engineers and scientists.