- November 28, 2017
- National Instruments Corporation
November 28, 2017 – NI, the provider of platform-based systems that are designed to enable engineers and scientists to solve the world’s greatest engineering challenges, announced the IC-3173 Industrial Controller, NI’s first IP67-rated controller. The controller is suited to act as an Industrial Internet of Things edge node in harsh locations including spray down manufacturing environments, test cells and outdoor locations without the need for a protective enclosure. The IP67 rating helps ensure operation in the presence of dust and water, in accordance to IEC standard 60529.
Industrial Controllers are fanless devices that deliver processing power and connectivity for automated image processing, data acquisition and control applications in extreme environments. These controllers feature up to a 2.2 GHz Intel Core i7 dual-core processor, 8 GB DDR3 RAM, 64 GB storage, four Power over Ethernet (PoE) GigE ports, two USB 3.0 ports and two DisplayPorts in a design with no moving parts, and now with an IP rating up to IP67. Industrial Controllers also include a user-programmable Xilinx Kintex-7 FPGA, which improves system performance by providing custom I/O timing, synchronization, control and image coprocessing capabilities.
Industrial Controllers are part of a growing number of products from NI that support Time Sensitive Networking (TSN), the next evolution of the IEEE 802.1 Ethernet standard that delivers distributed time synchronization, low latency and convergence of time-critical and general networking traffic. In addition to using TSN for controller-to-controller communication, engineers can also integrate highly synchronized sensor measurements using the TSN-enabled CompactDAQ Chassis released earlier this year.
NI (ni.com) empowers engineers and scientists with a software-centric platform that incorporates modular hardware and an expansive ecosystem. This approach puts users in control of defining what they need to accelerate their system design within test, measurement and control.