- July 14, 2014
July 14, 2014 – Hexagon Metrology released HP-O non-contact scanning probe for high accuracy measurement and inspection applications. The non-contact probe is an attractive alternative to conventional tactile analog measurement and scanning probes. The device exerts no physical impact on a part, delivering force-free measurement of blisks, blades, gear profiles and flank lines, and other potentially deformable parts, without a loss of accuracy. The HP-O probe’s 3mm diameter and measurement range of up to 20mm provide access to points that are not accessible to tactile probes. Optical measurements can be captured in single point or scanning mode. The HP-O probe delivers repeatability of under 0.3 μm when used with the Leitz PMM-C coordinate measuring machine (CMM) from Hexagon Metrology. Utilized for ultra-high accuracy inspections, HP-O’s scanning technology can be used to inspect metallic or sensitive part surfaces with mirror-like or polished finishes, eliminating the need to spray a part’s surface. With an acceptance angle of ±30 degrees, the probe can measure difficult-to-access features at a scanning speed of 1,000 points per second for rapid throughput. The HP-O’s scanning technology is not affected by ambient light, and is based on frequency-modulated, interferometric optical distance measurement. The probe’s dense data acquisition does not suffer from degradation at higher speeds. The HP-O’s high throughput capability renders it ideal for scanning large parts and parts that are rotationally symmetric. It is multi-sensor compatible in a single part program using a standard tool changer.