PANalytical enhances Omnian analysis software

  • May 23, 2010
  • Panalytical
PANalytical enhances Omnian analysis software
PANalytical enhances Omnian analysis software

May 23, 2010 - PANalytical extended the compatibility of its Omnian standardless analysis software to include the compact benchtop MiniPal 4 X-ray fluorescence (XRF) spectrometer. This combination offers a premium XRF solution that is both easy to use and extremely powerful. It is ideal for routine lab and field analysis, offering quantification of unknowns in situations where certified standards are not available. Ready for any sample type, Omnian provides elemental analysis of all materials no matter how they have been prepared. Typical applications include rapid screening, comparative analysis and R&D investigations. In the default ‘black box’ mode, Omnian provides fast answers for industries such as: healthcare, pharmaceutical, food, environmental, oil, minerals and mining. Unlike traditional standardless approaches, Omnian data is both comprehensive and available for detailed review. Omnian achieves accuracy through the automatic use of PANalytical’s Fundamental Parameters (FP) algorithm which deals with the analytical challenges posed by differing sample types. Other innovations include the support of multiple excitation conditions and the inclusion of several unique features. Fluorescence Volume Geometry (FVG) and Finite Thickness (FT) corrections, for example, improve accuracy when analyzing heavier elements in low density samples or samples with varying thicknesses. In addition, Adaptive Sample Characterization (ASC) minimizes particle size and mineralogical effects. This results in greater accuracy approaching the quality only achievable with dedicated calibration methods and standards.

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