- July 17, 2007
- Keithley Instruments
Cleveland, Ohio July 17, 2007 - Keithley Instruments announces a group of enhancements for its S600 Series Parametric Test Systems. The main enhancement is a migration to the Linux Operating System (OS) on the embedded control computer within each test system. This provides a more stable OS and longer service life for the computer, reducing the need for customers to qualify new workstations and upgrade software and hardware resources. In addition, firmware upgrades will provide throughput improvements compared to the earlier UNIX-based systems. A new software licensing method incorporates a hardware key for each tester in the form of a USB Stick, which can be transferred from workstation to workstation for fast repair times.Keithleys parametric test systems with Linux controllers join the growing list of semiconductor equipment types that now utilize the Linux OS. With its RF and parallel test options and appropriately designed test structures and probe cards, the Model S680 is the only RF test system on the market that can make simultaneous DC and RF measurements in parallel within the same probe touchdown. This yields substantially higher throughput than similar methods that perform sequential DC measurements followed by RF measurements.Compatibility. The Model S680 system using the new Linux controller will be compatible on a mixed system test floor. For customers who prefer a 100 percent Linux test floor, field upgrades are available. In any case, a newly installed Linux controller will operate seamlessly with existing parametric test systems operating under Solaris. For example:
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