BISTel introduces Dynamic Fault Detection (DFD) trace analysis solution | Automation.com

BISTel introduces Dynamic Fault Detection (DFD) trace analysis solution

BISTel introduces Dynamic Fault Detection (DFD) trace analysis solution

June 19, 2018 – BISTel, a provider of real-time data management, analytics and predictive solutions for smart manufacturing announced its first adaptive A.I. based applications to enable the smart connected factory or Industry 4.0.  Called Dynamic Fault Detection (DFD), BISTel’s fault detection solution offers customers sensor trace data analysis to detect faults.

BISTel’s Dynamic Fault Detection (DFD) system offers trace analysis. DFD establishes trace references dynamically and does not rely on the traditional control limiting methods used by FDC.  It eliminates manual modeling.  DFD also uses smarter algorithms to distinguish between real alarms and false alarms.

Sensor trace data contains a wealth of information that helps manufacturers identify yield issues, including ramp rate changes, spikes, glitches, shift and drift. BISTel’s online DFD system offers manufacturers real-time monitoring and detection of full sensor trace data. Customers can now detect, and analyze yield impacting events and resolve yield issues.  DFD® also integrates s to legacy FDC systems.

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