JTAG Technologies releases JT 2147/eDAK multi-function signal conditioning module | Automation.com

JTAG Technologies releases JT 2147/eDAK multi-function signal conditioning module

JTAG Technologies releases JT 2147/eDAK multi-function signal conditioning module

May 22, 2017: JTAG Technologies announced the release of a JTAG/boundary-scan test hardware interface product compatible with the MAC Panel mass interconnect system. The JT 2147/eDAK is a multi-function signal conditioning module that allows ‘ideal world’ connections from JTAG Technologies PXI and PXIe DataBlasters to the MAC panel ‘Scout’ connection system.

Based on the QuadPod architecture from JTAG Technologies, the JT 2147/eDAK is an enhancement of JTAG ‘s current DAK interface and has been specifically designed for high-integrity ATE systems.  In using the JT 2147/eDAK, test system builders may simplify their wiring task and, at the same time, retain the signal integrity assured by the QuadPod’s active interface.

In addition to four independent JTAG Test Access Ports (TAPs), the JT2147/eDAK features 64 digital I/O scan channels plus 16 ‘static’ DIOs. Each TAP can be programmed to operate through a range of voltage levels  and  two can also operate as other test and  programming interfaces such as BDM or SWD.

JTAG/boundary-scan applications prepared using JTAG Technologies ProVision or ‘Classic’ software tools may be executed on this PXI platform with driver packages that are available for NI LabView, TestStand and LabWindows alongside Geotest ATEasy and a number of generic language compilers (e.g. .NET framework, C++ and VB).

eDAK adapters utilize standard MAC Panel series connector modules, providing a wide variety of contact types. The connection between the PXI instrument and receiver module is accomplished using either a passive printed circuit board, active signal condition module (as with the JT 2147/eDAK) or flex circuit.

MORE PRODUCTS

VIEW ALL

RELATED