March 27, 2019 – AMETEK EDAX, has added a low-noise CMOS camera to its Velocity EBSD Camera Series. The Velocity Super offers EBSD mapping with indexing performance on real-world materials.
The Velocity EBSD Camera Series now includes two cameras tailored to specific EBSD analysis applications:
- Velocity Plus – collection speed up to 3,000 indexed points per second
- Velocity Super – collection speed up to 4,500 indexed points per second
Powered by a CMOS sensor, the Velocity EBSD Camera Series combines indexing speeds up to 4,500 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity cameras use 120 x 120 pixel EBSD patterns for band detection. This image resolution, combined with EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
The Velocity EBSD cameras can be integrated with EDAX EDS detectors to provide an analytical system for simultaneous EDS-EBSD collection. Furthermore, combining the collection with EDAX ChI-Scan analysis results in integrated data for phase differentiation.
This addition to the EDAX portfolio of EBSD cameras offers users another option for mapping and indexing to resolve crystallographic microstructures and help solve materials characterization challenges.
