August 14, 2013 – Keithley Instrumentsy announces the Model 2450 SourceMeter benchtop Source Measure Unit (SMU) instrument with a capacitive touchscreen graphical user interface. The SMU Instrument combines the intuitive touchscreen and icon-based control that novice SMU users can appreciate with the exceptional versatility that experienced users need to learn faster, work smarter, and invent easier. The Model 2450 incorporates numerous ease-of-use features that ensure a faster “time-to-answer” than competitive solutions, including a context-sensitive help function, “Quickset” modes that speed instrument configuration, and on-screen graphing capabilities that quickly turn raw data into usable results.
The Model 2450 combines the functionality of a power supply, true current source, 6-1/2-digit multimeter, electronic load, and trigger controller in one tightly integrated, half-rack instrument. With all of these capabilities, the Model 2450 integrates the capabilities of I-V systems, curve tracers, and semiconductor analyzers at a fraction of their cost.
Benchtop Application Advantages
Many of the Model 2450’s features help speed and simplify lab/benchtop work:
- Full-color, 5-inch touchscreen user interface: The full-color display and large on-screen characters enhance legibility.
- Extended measurement ranges with superior low current performance: The new low current (100nA, 10nA) and voltage (20mV) ranges eliminate the need to add separate low-level instruments to a benchtop system.
- Built-in context-sensitive help function: Help information is provided right where it’s needed through the touchscreen, minimizing the need to review a manual.
- Error and event logging: The touchscreen displays error messages and an event log to simplify diagnosing instrument errors, for higher productivity.
- KickStart start-up software: This “no-programming” instrument control software simplifies taking and graphing data in minutes.
A simple, icon-based menu structure allows reaching any measurement set-up panel with just a touch.
Back-panel triax cable connections eliminate the need for expensive cable adaptors, which can degrade low-level measurement performance.
For more complex analyses, data can be easily stored to disk, and then exported to Microsoft Excel or another software environment.
System-Level Application Advantages
Several features simplify integrating the Model 2450 into automated test systems:
- Embedded Test Script Processor (TSP): An onboard Test Script Processor embeds complete test programs into non-volatile memory within the instrument itself to provide higher test throughput by eliminating the GPIB traffic problems common to systems dependent on an external PC controller.
- TSP-Link inter-unit communication bus: Unlike users of mainframe-based systems, Model 2450 users are not constrained by power or channel count limitations.
- Model 2400 legacy mode: In addition to its native 2450 SCPI operating mode, the Model 2450 offers a 2400 SCPI operating mode for backward compatibility with existing 2400 SCPI programs.
- PC connectivity and automation: Rear panel triax connectors, multiple instrument communication interfaces (GPIB, USB 2.0, and LXI/Ethernet), a D sub 9-pin digital I/O port (for internal/external trigger signals and handler control), instrument interlock control, and TSP-Link jacks simplify configuring multi-instrument test setups.
TSP-Link connections support system expansion with multiple 2450s and other TSP instruments, including Series 2600B SMU instruments and the Model 3706A Switch/Multimeter.
Up to 32 Model 2450 instruments can be linked for multi-point or multi-channel parallel test, under the direction of a master unit’s TSP controller.
This preserves Model 2400 users’ software investments and eliminates the re-work normally associated with upgrading a system with a new instrument.
Pricing and Availability
The US list price of the Model 2450 is $5,400; a version without a front panel designed for integration into automated systems is available for $5,100. The Model 2450 is available for orders now.
