February 10, 2011 - PANalytical (Almelo, the Netherlands) acquired the XRF laboratories from the British Geological Survey - BGS (Keyworth, United Kingdom). The acquisition further strengthens PANalytical’s position in delivering full application solutions. The laboratories will continue to deliver highly advanced X-ray fluorescence (XRF) analysis to BGS and work closely together on research projects in the field of geochemical analysis. Dr.
Simon Milner, Product Marketing Manager XRF, PANalytical, said: “Adding BGS’s expertise on standards preparation and XRF application development to PANalytical’s broad range of XRF products and services will allow us to further expand our range of high-quality application solutions assisting our customer in industry in maximizing the benefits of our XRF spectrometers.” Professor John Ludden, Executive Director, BGS, said: “BGS use XRF for elemental analysis and chemical analysis, for research in geochemistry, forensic science and archaeology.” He continued: “The establishment of the PANalytical XRF labs at the BGS head office in Keyworth, near Nottingham, provides us with another tool to enhance external partnerships to improve the quality, reach and impact of our science.”
About British Geological Survey (BGS)
The British Geological Survey (BGS), a component body of the Natural Environment Research Council (NERC), is the nation's principal supplier of objective, impartial and up-to-date geological expertise and information for decision making for governmental, commercial and individual users. The BGS maintains and develops the nation's understanding of its geology to improve policy making, enhance national wealth and reduce risk. It also collaborates with the national and international scientific community in carrying out research in strategic areas, including energy and natural resources, our vulnerability to environmental change and hazards, and our general knowledge of the Earth system.
About PANalytical
PANalytical is the world’s leading supplier of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF), with more than half a century of experience. The materials characterization equipment is used for scientific research and development, for industrial process control applications and for semiconductor metrology.
