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Hexagon Metrology announces Optiv Classic 443 tp CMM

18 June, 2013
Hexagon Metrology announces Optiv Classic 443 tp CMM
Hexagon Metrology announces Optiv Classic 443 tp CMM
Classic 443 tp has accuracy of 1.9 microns, making it ideal for the inspection of small scale features and parts like micro-hole dies, sieves, filters, fiber optics and inkjet nozzles as well as complex, densely populated precision parts.

June 18, 2013 – Hexagon Metrology released the Optiv Classic 443 tp CMM. Each unit comes touch probe-ready and includes a high-resolution CCD (charge-coupled device) camera for multi-sensor applications with micro- to nano-scale precision measurement requirements.

The Classic 443 tp has first term accuracy of 1.9 microns, making it ideal for the inspection of small scale features and parts like micro-hole dies, sieves, filters, fiber optics and inkjet nozzles as well as complex, densely populated precision parts from the medical, aerospace, electronics or automotive industries. Highlights of the Classic 443 tp's innovative vision technology include calibrated lighting, a high resolution color CCD camera, and a multi-segment LED triple angle ring light to create better contrast for edge detection. The multi-sensor CMM features a 12x CNC motorized zoom for continuous adjustment of field of view and resolution, and an LED status indicator providing a quick visual check of the machine's status.

The Classic 443 tp comes standard with PC-DMIS Vision image processing software and optional online 3D CAD capabilities for live programming of the machine to compare measured values to nominals. The software includes the groundbreaking MultiCapture feature which finds all 2D characteristics in the field of view, regardless of their type, and measures them simultaneously. MultiCapture then moves the camera to the next cluster of features and measures them. This sequence continues until the inspection program is complete, and is automatically optimized by creating the most efficient path with the fewest number of stage movements. Inspection speeds increase by 50% or more, depending on feature size and density, which can significantly raise throughput.

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