Cleveland, Ohio — July 12, 2005 — Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published a semiconductor test reference handbook titled Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulsed, and RF—From Modeling to Manufacturing. The 140-page handbook describes emerging measurement challenges for semiconductor manufacturers as they move into the 65nm technology node and beyond. The handbook draws from the collective experience of Keithley’s parametric test and device characterization experts and the company’s customers. It covers a variety of emerging technologies and processes, such as:
- Challenges in RF wafer testing
- Gate dielectric reliability testing
- Charge pumping and reliability
- High frequency capacitance measurement
- Copper via testing
- Advanced SMU DC measurementsThe handbook also contains a glossary of commonly used terms in the semiconductor industry, including test and measurement terminology.
To request a free copy, call 1-888-KEITHLEY or visit www.keithley.com/pr/014.html .
For More Information.
For more information on Keithley's semiconductor test and measurement systems and instruments, contact the company at:Telephone:800-688-9951440-248-0400FAX: 440-248-6168Address: Keithley Instruments, Inc. 28775 Aurora Road Cleveland, OH 44139-1891 About Keithley. With more than 50 years of measurement expertise, Keithley Instruments ( www.keithley.com ) has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research.
By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry.
The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.
