July 24, 2008 - Keithley Instruments announces the availability of Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems: Demystifying WLAN and WiMAX Testing, a new guide to wireless and RF testing. This CD contains useful and informative RF testing resources, including application notes, articles, white papers, and product demonstrations, to help engineers reduce their cost of test by simplifying and solving the most challenging RF measurement applications.
The CD is available free of charge at www.ggcomm.com/Keithley/Jun08PR_RFHandbookCD.html Advanced Measurement Techniques for OFDM- and MIMO-based Radio Systems gives test engineers a broad range of information on the fast changing wireless communication and RF testing field for a wide array of applications, including spectrum analyzer power averaging, as well as the most challenging testing of the most complex signals, such as OFDM, MIMO, and WiMAX. In-depth application notes cover topics such as battery testing for mobile phones, RF semiconductor characterization, and RF and microwave signal switching in test setups.
The CD also includes an RF glossary and useful tables, such as wireless communication protocol specifications, dbM-Watts-Volts conversion tables, and VSWR loss conversion tables. About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices.
The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.