Cleveland, Ohio – June 27, 2006 - Keithley Instruments, Inc. (NYSE:KEI) will present an Industry Expert Seminar Series during SEMICON West 2006 at the Moscone Center in San Francisco, CA. To read the seminar abstracts or to register to attend, visit( www.keithley.com/pr/053 )Keithley test industry experts will be presenting the seminars on Wednesday, July 12, in Room 3010 in the West Hall Level 3 of the Moscone Center.
Doors open at 11 AM with refreshments served and a cocktail reception following the presentations beginning at 5 PM. Seminar presenters and topics include: • Rino Choi, SEMATECH, Advances and Challenges in Electrical Characterization of Novel Gate Stack Devices. • Dr.
Kang L Wang, UCLA, Spintronics and the Future of Semiconductors. • Bryan Root, Celadon, Best Practices in High Performance Multi-Site Wafer Probing. • Paul Meyer, Keithley Instruments, Flexible Architectures for Scalable Multi-Channel Reliability. • Andre Lalonde, Finisar, Increasing Functional Test Throughput Using Keithley System SourceMeters.
About Keithley Instruments, Inc. With 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Its products solve emerging measurement needs in production testing, process monitoring, product development, and research. The company’s customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device/wafer characterization and functional test, and the production of end products such as electronic assemblies or portable wireless devices.
The value Keithley provides its customers is a combination of precision measurement technology and a rich understanding of their applications to improve the quality, throughput, and yield of their products.