• ISA provides technical resources and standards to help industrial automation professionals advance their careers and the field. We enable automation professionals worldwide to solve problems and enhance their skills by bringing people together to create new technologies and share best practices with future automation professionals.
    • Industry Insights

  • We attract over 140,000 unique automation professionals monthly, making us the premier online content provider and the only dedicated electronic magazine in the automation industry.

    Monthly Magazine

    Back
    Back
  • M logo for Automation.com Monthly. Link to current issue.

Keithley's Model S680 Semiconductor Test Sustem Selected by AMD FAB 36 in Germany

Source: Keithley Instruments
02 February, 2005
1 min read

Cleveland, Ohio, USA—February 2, 2005— Keithley Instruments, Inc. (NYSE: KEI), a leader in solutions for emerging measurement needs, announced today that AMD (NYSE: AMD) has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany. The benefits of the S680DC/RF system include advanced measurement capability, lower cost of ownership through higher throughput, and strong local service and support.

"AMD’s selection of the Keithley Model S680 demonstrates the system’s acceptance as the parametric tester of choice for wafer-level electrical measurements for process control during high-volume manufacturing," stated Mark Hoersten, Keithley’s vice president for business development. "Manufacturers of both high-performance logic and high-performance analog Integrated Circuits are increasingly turning to Keithley to supply electrical parametric testers for the next-generation processes they are implementing in their most advanced fabs. These include 90nm and 65nm processes currently being deployed, along with their use in helping to develop the industry’s most advanced 45nm processes.”

First marketed in 2003, Keithley's Model S680 DC/RF tester is designed for wafer-level parametric testing of wireless communications and high-speed digital devices. This tester dramatically increases overall throughput by combining two critical test functions in a single system—DC and RF tests can be combined in the same test sequence. This integrated approach eliminates the long calibration and test times typical of separate RF test solutions. It also eliminates the need for a separate, costly, RF-only prober.

Furthermore, capabilities unique to Keithley’s test systems such as parallel test enable IC manufacturers to minimize their cost of test.For More Information Contact Keithley:Keithley Instruments, Inc. 28775 Aurora RoadCleveland, OH 44139-1891Telephone: 800-688-9951, 440-248-0400FAX: 440-248-6168E-mail: [email protected] Internet: www.keithley.com

Advertisement

Trending Articles

Advertisement

Related Articles

View all Articles and News
Advertisement
Advertisement