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Lion Precision introduces CPA100 Capacitive Sensor

Source: Lion Precision
10 February, 2011
Lion Precision introduces CPA100 Capacitive Sensor
Lion Precision introduces CPA100 Capacitive Sensor
The CPA100 Capacitive Sensor has a switched output to indicate presence/absence like a typical proximity switch, and a nonlinear analog output.

February 10, 2011 - The CPA100 Capacitive Sensor from Lion Precision has a setpoint (switched) output to indicate presence/absence like a typical proximity switch, but the nonlinear analog output is capable of resolutions as low as 15 nm RMS (150 nm p-p). The new sensor features a unique front panel range indicator to alert the operator to out-of-range conditions, DIN rail mount electronics, and user adjustments for Offset (Zero) and Gain. A selection of probes provides standard measurement ranges from 0.05 to 6 mm. Offset and Gain can also be controlled with remote potentiometers if the device is enclosed in a control panel.

Sync connectors allow interference-free use of multiple sensors with the same target. Typical applications for the CPA100, besides basic position monitoring, include production line part sorting; double sheet detection in printers or related processes; and monitoring of processes involving nonconductive materials such as films, fabrics, and applied coatings such as adhesives.

CPA100 Specifications:

Resolution:

0.03%F.S. RMS @ mid-range @15 kHz (typical)

Bandwidth:

15 kHz (-3dB)

Maximum Temp. Drift: Electronics:

0.2% F.S.

/°C; Probe: 0.05% F.S. /°C

Analog Output:

0-10 VDC

Setpoint Output:

Solid state switch closure; 30 VAC/60 VDC max

Operating Temperature:

40°F-120°F; 4°C-50°C

Input Power:

15-24 VDC, 2.5 W Lion Precision provides high-resolution capacitive and eddy-current noncontact displacement sensors that are optimized for specific applications including custom designs. Precision position and high-speed motion are common applications for these high-performance sensors. Lion Precision products are used in large industrial measurements and subnanometer resolution measurements of the micro- and nano-technology worlds.

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