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NI announces ATE Core Configurations

By: National Instruments Corporation
25 May, 2017
NI announces ATE Core Configurations
NI announces ATE Core Configurations
ATE Core Configurations deliver core mechanical, power and safety infrastructure designed to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive.

May 25, 2017 – NI, the provider of platform-based systems intended to enable engineers and scientists to solve the world’s greatest engineering challenges, announced ATE Core Configurations which deliver core mechanical, power and safety infrastructure designed to help users accelerate the design and build of automated test systems in industries ranging from semiconductor and consumer electronics to aerospace and automotive.

These 19-in., rack-based configurations are available in various rack-unit heights, and offer scalable power profiles to match the needs of nearly any application and geography. Test organizations can benefit from integrated safety features such as thermal shutoff, emergency power off (EPO), optional uninterruptible power supplies and IEC 61010 certification.

ATE Core Configurations also benefit from NI’s PXI instrumentation and test software portfolio. This includes more than 600 PXI instruments ranging from DC to mmWave featuring high-throughput data movement using PCI Express Gen 3 bus interfaces and sub-nanosecond synchronization with integrated timing and triggering. ATE Core Configurations can also include TestStand test management software and LabVIEW code module development software, extensive API and example program support for PXI instruments, and more than 13,000 instrument drivers for third-party box instruments.

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