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Physik Instrumente introduces XYZ Piezo Positioning stage

By: PI Vision
03 August, 2007
Physik Instrumente introduces XYZ Piezo Positioning stage
Physik Instrumente introduces XYZ Piezo Positioning stage
High-resolution piezo stages are designed for materials research, high resolution microscopy, ultra precision alignment and imaging applications.

August 3, 2007, PI (Physik Instrumente) offers the new P-733.3CD, XYZ nanopositioning & scanning system. These high-resolution piezo stages are designed for materials research, high resolution microscopy, ultra precision alignment and imaging applications. The parallel-kinematics design (only one common moving platform for XYZ) reduces the moved mass, and enables - together with the stiff design - higher operating speeds than other piezo scanning stages. A parallel metrology position sensor design provides highly accurate position information in all axes.

Features & Advantages:

  • Parallel Metrology with Capacitive Sensors for up to 0.1 Nanometers Resolution
  • Parallel Kinematics for Better Multi-Axis Accuracy and Dynamics
  • Frictionless Light-weighted Flexure Design for Sub-Millisecond Response
  • Long-Life Piezo Actuators, 100x100x10µm Travel Range Typical Applications: Surface Profiling, Metrology / Interferometry, Scanning Microscopy, Image Processing / Stabilization, Semiconductor Testing & Alignment NanomanipulationAbout P-733.3CD Nanopositioning Scanning StagesP-733 are fast and highly accurate XYZ nanopositioning and scanning stages.

These piezo systems provide a positioning and scanning range of 100x100x10 µm together with sub-nanometer resolution.

The high-speed Z-axis (sub-millisecond response time) can actively compensate out-of-plane, Z-axis deviation during XY scans, important for AFM applications.

The large clear aperture is an advantage in transmitted-light applications.

Capacitive Nano Measuring Sensors Provide Higher Linearity

Capacitive gauges measure the platform position directly and without physical contact.

This makes them free of friction and hysteresis, and allows very high levels of linearity, up to 99.99% with resolution to 0.1 nanometers.

The Parallel Metrology configuration measures the stage platform in all degrees of freedom against a common, fixed reference.

Parallel Kinematics Provide High Trajectory Fidelity

In a parallel kinematics multiaxis system, all actuators act directly on the same moving platform.

This means symmetrical dynamic properties of the X and Y axes, a prerequisite for fast, high-linearity scanning.

About PI

PI is a leading manufacturer of nanopositioning and precision motion-control equipment for photonics, nanotechnology, semiconductor and life science applications.

PI has been developing and manufacturing standard & custom precision products with piezoelectric and electromagnetic drives for 35+ years.

The company has been ISO 9001 certified since 1994 and provides innovative, high-quality solutions for OEM and research.

PI is present worldwide with eight subsidiaries and total staff of 450+.

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