May 19, 2017 -- Rohde & Schwarz America (RSA), a supplier of test & measurement equipment, and DA-Integrated, a company that offers production test systems for development, characterization and volume production, have announced that they have collaborated to develop an on-wafer RFIC production test system for RF and millimeter wave devices. The system uses Standard ATE Production IC Test Systems at DA-Integrated along with Rohde & Schwarz's R&S ZVA 67 GHz Vector Network Analyzer (VNA) to create a volume production test system capable of handling RF & millimeter wave integrated circuit devices.
New RF and millimeter wave applications, such as 5G mobile, automotive radar, active array antennas, WiGig and other wireless broadband systems, require appropriate on-wafer production test capability as a complement to the production robustness, speed and cost structures associated with automated test equipment (ATE) systems.
With IC technology moving to higher frequencies, design margins are shrinking, making the accuracy and precision of test instruments more critical in production testing. With this new system, customers benefit from the high volume scalability and robustness of the ATE system combined with the speed and accuracy of the Rohde & Schwarz vector network analyzer as required to test these new devices. Rohde & Schwarz vector network analyzers are designed to provide accurate and traceable results.
