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Keithley sponsors Weblog for Semiconductor testing

Source: Keithley Instruments
10 August, 2006
1 min read
Keithley Instruments, Inc. announces the first Weblog, or Blog, designed exclusively for engineers confronting testing issues in the semiconductor industry. The Semiconductor Test Blog informs visitors of the latest technical and business developments in the semiconductor industry and their impact on testing.

Cleveland , Ohio – August 10, 2006 - Keithley Instruments (NYSE:KEI) announces the first Weblog, or Blog, designed exclusively for engineers confronting testing issues in the semiconductor industry. The Semiconductor Test Blog informs visitors of the latest technical and business developments in the semiconductor industry and their impact on testing. The Blog is coordinated by Solid State Technology magazine and can be accessed directly at sst.pennnet.com The Blog contains links to a library of white papers and Webcasts, as well as announcements of upcoming conferences and events of interest to the semiconductor test and measurement community.

Visitors can also post responses to particular items or post questions to other Blog visitors. David M. Barach, Publisher of Solid State Technology, believes the Blog will play an important role in the semiconductor industry. “Engineers responsible for testing in the fast-paced semiconductor industry need to be aware of the latest developments in the field,” said Barach. “The new Semiconductor Test Blog is the hub for those seeking the most up to date information on the latest test techniques in developing next-generation semiconductor devices,” says Barach.

Mark Hoersten, Keithley’s Vice President of Business Management, stresses the importance of testing in new device research and development. “The ability to perform accurate and repeatable measurements at ever-shrinking device levels is critical to engineers developing next-generation semiconductor materials,” say Hoersten. “The Semiconductor Test Blog will help scientists and engineers stay ahead of the development curve.”

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