Cleveland, Ohio – February 1, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook. The 60-page handbook offers an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple tests on multiple scribe line test structures and helps semiconductor fabs maximize their test throughput and reduce their cost of test.
The handbook is available for no charge at: ggcomm.com/Keithley/PPTHandbook.html .
The handbook covers:
• The basics of parallel parametric test • The parallel test implementation process • Applying parallel parametric test to existing hardware setups • Test structure design for parallel testing Keithley’s Parallel Test Technology handbook also contains a section with sample programming code for a typical parallel test setup using pt_execute and a glossary of common parallel parametric test terminology. About Keithley. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research.
Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.